SJX-200MR Series Vertical Metallographic Microscope

Performance Features
• Optical system: Finite-distance aberration correction optical system – excellent image quality
• Eyepiece and objective lens: a) High-eyepoint plane-field eyepiece PL10X (linear field of view: 18 mm) – provides a wide,
flat observation area and supports the installation of various micrometric scales.
b) Long working-distance professional achromatized metallographic objective lens b) Long working-distance
professional achromatized metallographic objective lens
c) Cover glass-free design – excellent image quality c) Cover glass-free design – excellent image quality
• Lighting system: Downlight Cora illumination featuring an anti-reflective design that effectively minimizes interference
from reflected light, resulting in clearer images and improved field of view contrast.
• Features an adaptive wide-voltage range (100 V–240 V) 6 V/30 W halogen lamp with an adjustable filament center and
continuously adjustable light intensity, providing ample illumination and effectively enhancing image quality.
• Sample Stage: A composite mechanical mobile platform featuring low-hand-position coaxial adjustment; this platform is
equipped with an additional 180 mm × 145 mm flat surface, facilitating the placement of larger specimens.
• Attachment a): Four color filters (yellow, green, blue, and white) can be incorporated into the lighting path to provide
illumination with varying chromaticity for observing various samples.
b) A polarizing beam splitter and an analyzer can be incorporated into the illumination optical path to enable polarized light
observation. b) A polarizing beam splitter and an analyzer can be incorporated into the illumination optical path to
enable polarized light observation.
c) Polarizer ±25° – adjustable; enables effective adjustment of orthogonal state or field-of-view contrast. c) Polarizer ±25°
– adjustable; enables effective adjustment of orthogonal state or field-of-view contrast.